High voltage gain switched capacitor filter integration

ABSTRACT

A method of operating switched capacitor filter integration circuits by pre-charging a final filter capacitor thereof with the final full voltage gain value during a first subframe to obtain an enhanced signal to noise ratio without changes to the circuit or components thereof.

FIELD

The disclosure relates to readout circuits, and more particularly, to aswitched capacitor filter subframe integration scheme useful in readoutintegrated circuits.

BACKGROUND

Charge coupled devices (CCDs), complementary metal oxide semiconductor(CMOS) devices, and infrared imagers, which may be referred to generallyas Solid State Area Array Imaging Devices (SSAAIDs), are used to captureimages received in the form of light. They are currently widely used forboth defense and commercial purposes. Some popular uses include digitalcameras, scanners, cell phones, and surveillance devices.

SSAAIDs contain pixels arranged in a grid, which is referred to as aFocal Plane Array (FPA). Each pixel of an SSAAID generates and holds anamount of charge proportionate to the intensity of light incidentthereon and the length of time that light was allowed to fall on thepixel using an integration circuit.

An integration circuit performs the mathematical operation ofintegration with respect to time. Said another way, the output voltageof an integration circuit is proportional to the input voltage,integrated over time (Output∝ ∫Input). In the case of a pixel, the inputvoltage is generated by the impact of photons on a detector. The chargehandling capacity of such a circuit is determined by voltage,integration time, and capacitance of its capacitor(s).

Furthermore, current SSAAIDs are limited in their ability to provideacceptable images in moderate to low light level conditions as well asin high light level conditions by the dynamic range of the integrationcircuit of the pixels. In low light level conditions, where there arerelatively few incoming photons incident on any given pixel, thesignal-to-noise ratio (SNR) of the output is very low, resulting in agrainy/noisy image in dark areas of the image. Moreover, in low SNRsituations, other variables can also create non-uniformities in theimages where the signal levels are not sufficient to overcome thesensitivity anomalies.

Pixel integration circuits may also become saturated in high light levelconditions. When a large amount of light hits a pixel, the integrationcircuit of that pixel, and even those of nearby pixels, due to aphenomenon referred to as “blooming”, become saturated, a situation thatresults in the integration circuit ceasing to be able to captureadditional information. Saturation results in washed out images orportions thereof. Although anti-blooming circuits may be used to helpreduce the impact of one or a cluster of saturated pixels on others, toincrease high light level performance of a given pixel requiresincreasing the capacity, or well size, of its integration circuit,thereby preventing saturation over a given interval of time.

Prior art FPAs have used shorter integration times to provide better lowgain, or high light, performance, but are less sensitive as a result andtherefore less able to capture low light level conditions.

Prior art FPAs have also used switched capacitor filter circuits in suchintegration circuits to create a larger effective well capacity when thedesired integration capacitor does not fit within the detector area.Their performance, however, especially their signal to noise ratio andgain flexibility, is not optimal for this application.

What is needed, therefore, are techniques for improving signal to noiseratio in switched capacitor filter integration circuits such thatimprovements in signal to noise ratio are realized while maintainingtheir current advantage of providing a larger effective well capacitywhen the desired integration capacitor does not fit within the detectorarea.

SUMMARY

The present disclosure describes a new way of operating switchedcapacitor filter integration circuits that improves their signal tonoise ratio performance. The method is especially useful when reducingthe number of subframes from a design value. Methods described hereinallow for higher transimpedance gain for the same total integration timein a frame. Furthermore, the current advantage of switched capacitorfilter integration circuits, i.e. providing a larger effective wellcapacity when the desired integration capacitor does not fit within thedetector area, is maintained.

The method does not require extra components compared to theconventional circuit. Rather, the method disclosed herein accomplishesthe aforementioned benefits using a more complex timing pattern ascompared to prior art methods of operating switched capacitor filterintegration circuits.

Specifically, by pre-charging a final filter capacitor of a switchedcapacitor filter integration circuit with the final full voltage gainvalue, significant benefits are obtained. This is done by running afirst subframe with integration and filter capacitors combined as onelarger integration capacitor, bypassing the switched capacitor filter,prior to reverting to more conventional switched capacitor filtertiming.

Essentially, this can be thought of as pre-setting the sum capacitorbased on the very first subframe alone to what is assumed to be close toits final value. This can be thought of more simply as starting arunning average at what you believe the end average will be based on thefirst value obtained.

Such a method of operating the switched capacitor filter integrationcircuit gives reasonable voltage gain even when using numbers ofsubframes with relatively few switched capacitor filter time constants.Such a method also provides slightly better performance relative toprior art methods even when using the optimum number of subframes forsignal to noise ratio.

Furthermore, the extra voltage obtained by operating the switchedcapacitor filter subframe integration circuit in accordance with theteachings of the present disclosure suppresses any additional readoutnoise caused by such a method of operation.

One embodiment of the present disclosure provides a method of operatinga switched capacitor filter subframe integration circuit comprising: ona switched capacitor filter subframe integration circuit comprising asplit switch, a sum switch, an integration capacitor, a split capacitor,and a sum capacitor: closing all switches, thereby resetting allcapacitors; integrating a first subframe across all capacitorssimultaneously; resetting the integration capacitor and split capacitor;integrating a second subframe on the integration capacitor and splitcapacitor; opening the split switch; closing the sum switch, therebyallowing the charge on the split capacitor to flow into the sumcapacitor; repeating the above steps pertaining to integrating thesecond subframe as many times as desired to complete subframeintegration with desired levels of voltage gain and noise.

Another embodiment of the present disclosure provides such a methodwherein the sum capacitor is larger than the other capacitors.

A further embodiment of the present disclosure provides such a methodwherein the integration time of the first subframe is longer than thatof subsequent subframes in accordance with the ratio:Fsint=(Cint+Csp+Csum)/(Cint+Csp)

Where:

Fsint=First Subframe Interval (ms)

Cint=Capacitance of the integration capacitor

Csp=Capacitance of the split capacitor

Csum=Capacitance of the sum capacitor

Yet another embodiment of the present disclosure provides such a methodwherein the combined capacitance of all capacitors is double that of theintegration and split capacitors.

A yet further embodiment of the present disclosure provides such amethod wherein integration time is scaled based on the size of the sumcapacitor relative to the integration and split capacitors to maintain adesired gain.

Still another embodiment of the present disclosure provides such amethod wherein the integration time is increased proportionately to theincrease in capacitance to the switched capacitor filter subframeintegration circuit.

One embodiment of the present disclosure provides a method of operatinga switched capacitor filter subframe integration circuit comprising:during a first integration interval, setting the voltage of a sumcapacitor equal to what is seen on an integration capacitor.

Another embodiment of the present disclosure provides such a methodwherein the sum capacitor is larger than other capacitors included onthe integration circuit.

A further embodiment of the present disclosure provides such a methodwherein the integration time of the first subframe is longer than thatof subsequent subframes in accordance with the ratio:Fsint=(Cint+Csp+Csum)/(Cint+Csp)

Where:

Fsint=First Subframe Interval (ms)

Cint=Capacitance of an integration capacitor

Csp=Capacitance of a split capacitor

Csum=Capacitance of the sum capacitor

Yet another embodiment of the present disclosure provides such a methodwherein the combined capacitance of all capacitors present on theintegration circuit is double that of an integration capacitor and asplit capacitor present thereon.

A yet further embodiment of the present disclosure provides such amethod wherein integration time is scaled based on the size of the sumcapacitor relative to an integration capacitor and a split capacitorpresent on the integration circuit to maintain a desired gain.

Still another embodiment of the present disclosure provides such amethod wherein integration time is increased proportionately to increasein capacitance.

One embodiment of the present disclosure provides a method of operatinga switched capacitor filter subframe integration circuit comprising: ona switched capacitor filter subframe integration circuit comprising asplit switch, a sum switch, an integration capacitor, a split capacitor,and a sum capacitor, wherein the switched capacitor filter subframeintegration circuit is fixed to and in operative communication with apixel: closing all switches, thereby resetting all capacitors;integrating a first subframe across all capacitors simultaneously;resetting the integration capacitor and split capacitor; integrating asecond subframe on the integration capacitor and split capacitor;opening the split switch; closing the sum switch, thereby allowing thecharge on the split capacitor to flow into the sum capacitor; repeatingthe above steps pertaining to integrating the second subframe as manytimes as desired to complete subframe integration with desired levels ofvoltage gain and noise.

Another embodiment of the present disclosure provides such a methodwherein the sum capacitor is larger than the other capacitors.

A further embodiment of the present disclosure provides such a methodwherein the integration time of the first subframe is longer than thatof subsequent subframes in accordance with the ratio:Fsint=(Cint+Csp+Csum)/(Cint+Csp)

Where:

Fsint=First Subframe Interval (ms)

Cint=Capacitance of the integration capacitor

Csp=Capacitance of the split capacitor

Csum=Capacitance of the sum capacitor

Yet another embodiment of the present disclosure provides such a methodwherein the combined capacitance of all capacitors is double that of theintegration and split capacitors.

A yet further embodiment of the present disclosure provides such amethod wherein integration time is scaled based on the size of the sumcapacitor relative to the integration and split capacitors to maintain adesired gain.

Still another embodiment of the present disclosure provides such amethod wherein the integration time is increased proportionately to theincrease in capacitance to the switched capacitor filter subframeintegration circuit.

The features and advantages described herein are not all-inclusive and,in particular, many additional features and advantages will be apparentto one of ordinary skill in the art in view of the drawings,specification, and claims. Moreover, it should be noted that thelanguage used in the specification has been principally selected forreadability and instructional purposes, and not to limit the scope ofthe inventive subject matter.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic illustrating a conventional switched capacitorfilter subframe integration circuit;

FIG. 2A is a chart illustrating switched capacitor filter subframeintegration timing in a conventional subframe integration circuit;

FIG. 2B is a chart illustrating switched capacitor filter subframeintegration timing in a high voltage gain subframe integration circuit,in accordance with embodiments of the present disclosure;

FIG. 3 is a graph illustrating the voltage output (y-axis) from aswitched capacitor filter comparing standard and high voltage timingrelative to the number of integration subframes (x-axis), in accordancewith embodiments of the present disclosure;

FIG. 4 is graph illustrating switched capacitor filter noise output(y-axis) for standard and high voltage timing relative to the number ofsubframes (x-axis), in accordance with embodiments of the presentdisclosure; and

FIG. 5 is a graph illustrating switched capacitor filter signal to noiseratio for standard and high voltage timing compared to an idealintegrator with read noise relative to the number of subframes, inaccordance with embodiments of the present disclosure.

DETAILED DESCRIPTION

A typical switched capacitor filter subframe integration circuit 100 isshown in FIG. 1. The switched capacitor filter subframe integrationcircuit 100 comprises a split switch 102, a sum switch 104, anintegration capacitor (C_(int)) 106, a split capacitor (C_(sp)) 108, anda sum capacitor (C_(sum)) 110.

The time constant of such a switched capacitor filter subframeintegration circuit 100 is determined by the size of the split capacitor(C_(sp)) 108, with a larger split capacitor providing a shorter timeconstant. Specifically, the ratio of capacitance of C_(sum) 110 toC_(split) 108 determines the time constant.

Now referring to FIGS. 2A and 2B, the convention in these figures isthat a high level indicates a closed switch and a low level indicates anopen switch. The completion of a reset is indicated by the reset (RS)clock going low. The integration time is shown in black.

In each figure, the total integration time for each frame to be read outof the switched capacitor filter subframe integration circuit 100 isdivided into a number of subframe integration times. At the beginning ofthe integration of each frame, all switches are closed and allcapacitors are reset. During each subframe, there is an integration andfilter timing sequence. Integration begins when the reset completes.Although the capacitors and switch are shown referenced to ground, inpractice different reference voltages may be used for each of thecapacitors and the reset switch in place of the ground.

During a normal integration interval, integration occurs on theintegration capacitor 106 and split capacitor 108 only. Integration endswhen the split switch 102 opens, as indicated by the falling split (SP)clock.

The SUM switch 104 closes following integration, allowing the charge onthe split capacitor 108 to flow into the relatively larger sum capacitor110. This charge sharing performs filtering, with a time constantdetermined by the ratio of the capacitance of the split capacitor 108 tothat of the sum capacitor 110.

After summing, the integration capacitor 106 and split capacitor 108 arereset and integration is ready to begin again. The subframe timing isrepeated as many times as desired to complete frame integration withdesired levels of voltage gain and noise.

To summarize, switched capacitor filter subframe integration circuits100 essentially create an effectively larger well than could beaccomplished using a single well by filtering a number of shortintegration times for each frame. One disadvantage of this, however, isthat such circuits operated in accordance with prior art methods requirea number of subframes to build the voltage of the sum capacitor 110 tonear that of the integration level.

The switched capacitor filter subframe integration circuit 100 operatingin accordance with methods taught by the present disclosure described bythe chart in FIG. 2B shows an alternate switched capacitor filtersubframe integration circuit 100 timing that allows it to overcome thisdisadvantage while providing a better signal to noise ratio withoutsacrificing the inherent gain flexibility of this circuit.

The difference in behavior of the switched capacitor filter subframeintegration circuit 100 operating in accordance with methods taught bythe present disclosure described by FIG. 2B is due to the first subframebeing integrated on all capacitors (C_(int) 106, C_(sp) 108, and C_(sum)110) simultaneously. In embodiments, subframe integration time isincreased to provide similar gain values when making use of capacitorshaving larger values of capacitance. In embodiments, the first subframetiming is made longer in accordance with the ratio:F _(sint)=(C _(int) +C _(sp) +C _(sum))/(C _(int) +C _(sp))

Where:

F_(sint)=First Subframe Interval (ms)

C_(int)=Capacitance of the integration capacitor 106

C_(sp)=Capacitance of the split capacitor 108

C_(sum)=Capacitance of the sum capacitor 110

By adjusting the first subframe interval in accordance with this ratio,it is made to exactly match the gain of subsequent shorter subframes,which are similar to those of the prior art standard switched capacitorfilter timing. Using this timing ratio, the sum capacitor 110, from thestart, is charged to its final value, assuming the integration currentremains reasonably constant during the frame. Subsequent subframes areused to further reduce noise by providing further filtering. If theintegration current does vary, the switched capacitor filter subframeintegration circuit 100 operated in accordance with this method providesthe same gain as a switched capacitor filter subframe integrationcircuit 100 operated in accordance with prior art techniques.

By way of example, if a switched capacitor filter subframe integrationcircuit 100 is thought of as a running averager, the technique describedherein could be thought of as starting the running average with theinitial value, rather than starting from zero, as had been done in thepast.

Now referring to FIG. 3, the operation of both timing types is shown, asmodeled in Mathcad, demonstrating the advantages of switched capacitorfilter subframe integration circuits 100 operated in accordance withmethods taught by the present disclosure using altered timing. FIG. 3shows a Mathcad model of the two methods (conventional v. presentdisclosure) of operating a switched capacitor filter subframeintegration circuit 100. The plot shows switched capacitor outputvoltage as a function of subframe number. For this model, the combinedcapacitance of all the capacitors (C_(int) 106, C_(sp) 108, and C_(sum)110) is double that of the integration capacitance (c_(int)+C_(sp))alone, i.e. the capacitance of C_(sum) 110 is equal to the integrationcapacitance. This results in the first subframe of the high voltagetiming in accordance with embodiments of the present disclosure takingtwice as long to readout as the first subframe of the standard timing.

For the modeling shown in FIG. 3, a 20% well fill is used to make readnoise effects more apparent where the voltage gain is low. To maintainthe same total integration time for both cases as a function of subframenumber, the first subframe of the high voltage timing is divided intotwo subframes, with the first subframe having the value of the half-fullwell. This “half integration” value leads to the discontinuityassociated with that point.

In FIG. 3, the solid line (V_(sig) _(n) _(,10)) is the standard timingwhere voltage increases gradually with the number of subframes. Thedashed line (V_(sig nt) _(n) _(,10)) denotes high voltage timing inaccordance with methods taught by the present disclosure where thevoltage is set in the first double subframe up to the final value.

Following readout of the first subframe, the overall voltage level ofthe high voltage timing embodiment modeled in FIG. 3 does not changesignificantly, since, in this simulation, the input signal is heldconstant. If the actual signal flux changed, the output would follow itjust as it would for a regular switched capacitor filter.

Now referring to FIG. 4, the noise output of a switched capacitor filtersubframe integration circuit 100 as a function of subframes, including aread noise term, is shown. From this figure, it can be seen that noisestarts relatively higher when employing high voltage timing inaccordance with embodiments of the present disclosure (see dashed line,V_(noi nt) _(n) _(, 10)), before asymptotically approaching the samevalue as conventional methods of operating switched capacitor filtersubframe integration circuits 100 (V_(noin,10)) as the readout ofadditional subframes is completed. The step present in the high voltagetiming portion of the graph is an artifact created by the data pointbeing halfway through the 1st subframe of that embodiment; the highpoint is the first valid data point. As will be shown by FIG. 5, despitethe apparent noise advantage of prior art methods, when the SNR ratio ofeach method is taken into account, the superiority of the methodsdisclosed herein become clear.

Now referring to FIG. 5, the signal to noise ratio of the switchedcapacitor filter output is shown, highlighting the improved performanceof switched capacitor filter subframe integration circuits 100 using themethods taught by the present disclosure compared to those of the priorart. In this graph, a higher signal to noise ratio indicates betterperformance. Included on this graph, in addition to conventional andmodified methods, is a third case, an ideal integrator with readoutnoise (see long-dashed line, SNR_(Int)__(read) _(n) _(,10)). This idealcase assumes that the input cell allows for a single integrationcapacitor big enough to integrate the entire time, which is not oftenthe case. It represents the maximum theoretically-obtainable performanceof such a circuit, especially in the case of a small number ofsubframes.

It can be seen in FIG. 5 that high voltage timing (see short-dashedline, SNR_SCF_nt_(n,10)) bridges some of the performance gap between aswitched capacitor filter subframe integration circuit 100 operated inaccordance with prior art methods and the ideal integrator. For thefirst long subframe, the cases are identical, since the operation of thefilter is exactly as one integration capacitor (the ideal case) up tothat point. Following the first integration, performance of the switchedcapacitor filter subframe integration circuit 100 operated in accordancewith the teachings of the present disclosure falls away slightly, butstill improves on prior art methods of operating the switched capacitorfilter subframe integration circuit 100. How long embodiments of thepresent disclosure maintain their performance benefit depends somewhaton the well fill, which is about 20% in the charted case shown in FIG.5.

In embodiments, a first integration occurs over approximately 2 ms whilesubsequent integrations occur over approximately 1 ms per integration.

In embodiments, a first integration occurs over approximately 2.9 mswhile subsequent integrations occur over approximately 1.45 ms perintegration.

Although the present disclosure primarily discusses readout circuits,the concepts discussed herein could be applied to any application usinga switched capacitor filter for distinct short periods.

The foregoing description of the embodiments of the disclosure has beenpresented for the purposes of illustration and description. It is notintended to be exhaustive or to limit the disclosure to the precise formdisclosed. Many modifications and variations are possible in light ofthis disclosure. It is intended that the scope of the disclosure belimited not by this detailed description, but rather by the claimsappended hereto.

What is claimed is:
 1. A method of operating a switched capacitor filtersubframe integration circuit comprising: on a switched capacitor filtersubframe integration circuit comprising a split switch, a sum switch, anintegration capacitor, a split capacitor, and a sum capacitor; closingthe split switch and the sum switch, thereby resetting the integrationcapacitor, the split capacitor, and the sum capacitor; integrating afirst subframe across the integration capacitor, the split capacitor,and the sum capacitor simultaneously; resetting the integrationcapacitor and the split capacitor; integrating a second subframe on theintegration capacitor and the split capacitor; opening the split switch;closing the sum switch, thereby allowing the charge on the splitcapacitor to flow into the sum capacitor; repeating the step ofintegrating the second subframe as many times as desired to completesubframe integration with desired levels of voltage gain and noise;wherein an integration time of the first subframe is longer than that ofsubsequent subframes in accordance with the ratio:Fsint=(C _(int) +Cs _(p) +C _(sum))/(C _(int) +C _(sp)) Where:F_(sint)=First Subframe Interval (ms) C_(int)=Capacitance of theintegration capacitor C_(sp)=Capacitance of the split capacitorC_(sum)=Capacitance of the sum capacitor.
 2. The method of claim 1wherein the sum capacitor is larger than the integration capacitor andthe split capacitor.
 3. The method of claim 1 wherein a combinedcapacitance of the integration capacitor, the split capacitor, and thesum capacitor is double that of the integration and the split.
 4. Themethod of claim 1 wherein the integration time is scaled based on thesize of the sum capacitor relative to the integration and the splitcapacitor to maintain a desired gain.
 5. The method of claim 1 whereinthe integration time is increased proportionately to the increase incapacitance to the switched capacitor filter subframe integrationcircuit.
 6. A method of operating a switched capacitor filter subframeintegration circuit comprising: during a first integration, setting avoltage of a sum capacitor equal to what is seen on an integrationcapacitor, wherein an integration time of a first subframe is longerthan that of subsequent subframes in accordance with the ratio:Fsint=(C _(int) +C _(sp) +C _(sum))/(C _(int) +C _(sp)) Where:F_(sint)=First Subframe Interval (ms) C_(int)=Capacitance of theintegration capacitor C_(sp)=Capacitance of a split capacitorC_(sum)=Capacitance of the sum capacitor.
 7. The method of claim 6wherein the sum capacitor is larger than the integration capacitor andthe split capacitor.
 8. The method of claim 6 wherein a combinedcapacitance of the integration capacitor, the split capacitor, and thesum capacitor present on the integration circuit is double that of theintegration capacitor and the split capacitor present thereon.
 9. Themethod of claim 6 wherein the integration time is scaled based on thesize of the sum capacitor relative to the integration capacitor and thesplit capacitor present on the integration circuit to maintain a desiredgain.
 10. The method of claim 6 wherein the integration time isincreased proportionately to increase in capacitance.
 11. A method ofoperating a switched capacitor filter subframe integration circuitcomprising: on a switched capacitor filter subframe integration circuitcomprising a split switch, a sum switch, an integration capacitor, asplit capacitor, and a sum capacitor, wherein the switched capacitorfilter subframe integration circuit is fixed to and in operativecommunication with a pixel; closing the split switch and the sum switch,thereby resetting the integration capacitor, the split capacitor, andthe sum capacitor; integrating a first subframe across the integrationcapacitor, the split capacitor, and the sum capacitor simultaneously;resetting the integration capacitor and the split capacitor; integratinga second subframe on the integration capacitor and the split capacitor;opening the split switch; closing the sum switch, thereby allowing thecharge on the split capacitor to flow into the sum capacitor; repeatingthe integration of the second subframe by repeating the steps of openingthe split switch and closing the sum switch as many times as desired tocomplete subframe integration with desired levels of voltage gain andnoise, wherein an integration time of the first subframe is longer thanthat of subsequent subframes in accordance with the ratio:Fsint=(C _(int) +C _(sp) +C _(sum))/(C _(int) +C _(sp)) Where:F_(sint)=First Subframe Interval (ms) C_(int)=Capacitance of theintegration capacitor C_(sp)=Capacitance of the split capacitorC_(sum)=Capacitance of the sum capacitor.
 12. The method of claim 11wherein the sum capacitor is larger than the integration capacitor andthe split capacitor.
 13. The method of claim 11 wherein a combinedcapacitance of the integration capacitor, the split capacitor, and thesum capacitor is double that of the integration and the split capacitor.14. The method of claim 11 wherein the integration time is scaled basedon the size of the sum capacitor relative to the integration and thesplit capacitor to maintain a desired gain.
 15. The method of claim 11wherein the integration time is increased proportionately to theincrease in capacitance to the switched capacitor filter subframeintegration circuit.